Fabrication of carbon nanomembranes by helium ion beam lithography

• Xianghui Zhang,
• Henning Vieker,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2014, 5, 188–194, doi:10.3762/bjnano.5.20

• characterized by bulge test in an atomic force microscope (AFM): biphenyl-based CNMs possess a Young’s modulus of ca. 10 GPa and a remarkable tensile strength of ca. 600 MPa [4]. The possibility of transferring CNMs and their high mechanical strength make them suitable candidates for nanoelectromechanical

Mechanical characterization of carbon nanomembranes from self-assembled monolayers

• Xianghui Zhang,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2011, 2, 826–833, doi:10.3762/bjnano.2.92

•  nm that are fabricated by electron-induced crosslinking of aromatic self-assembled monolayers (SAMs). A novel type of in situ bulge test employing an atomic force microscope (AFM) is utilized to investigate their mechanical properties. A series of biphenyl-based molecules with different types of

• -based CNMs are investigated and discussed. Keywords: bulge test; carbon nanomembrane; mechanical characterization; self-assembled monolayers; two-dimensional materials; Introduction Ultrathin freestanding nanomembranes have recently attracted much attention as promising materials in nanotechnology [1

• a laser sensor [16]. An optical detection of CNMs is not feasible due to their thickness of only 1 nm. However, it is straightforward to perform a complete bulge test with an AFM deflection measurement and thus to improve the resolution such that bulge testing becomes practicable for the